Sonstiges 2015
Contribution to a book
Stoichiometry in epitaxial oxide thin films
Epitaxial growth of complex oxides
Cambridge : Elsevier 15 pp. (2015)
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Contribution to a book
Redox-based Resistive Memory
Emerging Nanoelectronic Devices
Malden, USA : Wiley-Blackwell 137-161 (2015)
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Contribution to a conference proceedings
Insulator-metal transition associated with resistive switching in real SrTiO3 and TiO2 crysta
[Proceedings] - ISBN 978-1-4799-9974-3
2015 Joint IEEE International Symposium on the Applications of Ferroelectric (ISAF), International Symposium on Integrated Functionalities (ISIF), and Piezoelectric Force Microscopy Workshop (PFM), SingaporeSingapore, Singapore, 24 May 2015 - 27 May 2015
IEEE 10 pp. (2015) [10.1109/ISAF.2015.7172690]
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Dissertation / PhD Thesis/Book
Ladungstransportuntersuchungen an nanofunktionalen Bauelementen mit Diodencharakteristik basierend auf funktionalisierten Nanopartikeln
Jülich : Forschungszentrum Jülich GmbH Zentralbibliothek, Verlag, Schriften des Forschungszentrums Jülich. Reihe Information / information 42, iv, 138, XLVII S. (2015) = RWTH Aachen, Diss., 2014
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Dissertation / PhD Thesis/Book
Micro-spectroscopic investigation of valence change processes in resistive switching SrTiO$_{3}$ thin films
Jülich : Forschungszentrum Jülich GmbH Zentralbibliothek, Verlag, Schriften des Forschungszentrums Jülich. Reihe Information / information 39, viii, 166 S. (2014) = RWTH Aachen, Diss., 2014
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Dissertation / PhD Thesis/Book
Study on the electroforming and resistive switching behaviour of nickel oxide thin films for non-volatile memory applications
Jülich : Forschungszentrum Jülich GmbH Zentralbibliothek, Verlag, Schriften des Forschungszentrums Jülich. Reihe Schlüsseltechnologien / Key Technologies 109, XXI, 159 S. (2015) = RWTH Aachen, Diss., 2015
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Dissertation / PhD Thesis
Integration of Redox-based Resistive Switching Memory Devices
Jülich : Forschungszentrum Jülich GmbH Zentralbibliothek, Verlag, Schriften des Forschungszentrums Jülich. Reihe Information / Information 41, 166 S. (2015) = RWTH Aachen, Diss., 2014
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Proceedings
Critical ReRAM Stack Parameters Controlling Complimentary versus Bipolar Resistive Switching
2015 IEEE International Memory Workshop (IMW), MontereyMonterey, CA, 17 May 2015 - 20 May 2015
IEEE (2015) [10.1109/IMW.2015.7150281]
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